Search   
Explore   
  Photonics Research Laboratories Home > Focused Ion Beam (FIB)
Photonics Research Laboratories
   Home
   People
   Projects
   Focused Ion Beam (FIB)
   Publications
   Reach us
   Physics & Astronomy Home
   Engineering Physics Home
   
Focused Ion Beam (FIB)

One of the capabilities offered by the Canadian Centre for Electron Microscopy here at McMaster University is sample milling using the focused ion beam (FIB) technique. A focused ion beam can be used to prepare a cross-sectional TEM specimen. The following images demonstrate the preparation of such samples.

1 2 3
4 5 6
Figure:
1. Silicon sample surface irradiated with femtosecond laser pulses, showing rippling structures.
2. Protective layer deposited prior to FIB milling to protect target area.
3. Ion milling carried out on both sides of the desired cross-section area.
4. The thinned section is detached from the sample and lifted out with a manipulator.
5. The thinned section is attached to a TEM grid.
6. Further thinning of the sample is carried out for TEM analysis.
 

Interested in joining our group? Check out our Research Opportunities page.

 Back to Top

Maintained by PRL
Designed by Dan O'Donnell, odonnedv@mcmaster.ca